BASF SE; BASF (CHINA) COMPANY LIMITED; LANGER, Nicolle; SCHAeFER, Thomas; SCHILDKNECHT, Christian; LENNARTZ, Christian; WAGENBLAST, Gerhard
Patent: WO2012/4765 A2, 2012 ;
Location in patent: Page/Page column 73-74 ;

BASF SE
Patent: US2012/7063 A1, 2012 ;

ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD.; KIM, Chi-sik; KIM, Hee-sook; LEE, Hyo-jung; KIM, Hye-mi; MOON, Doo-hyeon; HWANG, Soo-jin; LEE, Seon-woo; YANG, Soo-jin; LEE, Su-hyun; LEE, Kyung-joo; SHIN, Hyo-nim; PARK, Kyoung-jin; CHO, Young-jun; KWON, Hyuck-jun; KIM, Bong-ok
Patent: WO2013/12298 A1, 2013 ;
Location in patent: Paragraph 101-012 ;

Lee; Jung; Hahn
Asian Journal of Chemistry, 2013 , vol. 25, # 1 p. 501 - 504

Lee; Jung; Hahn
Asian Journal of Chemistry, 2013 , vol. 25, # 1 p. 501 - 504

EP1820801 A1, ;

Page/Page column 84; 85 ;

WO2013/12298 A1, ;

Paragraph 103-104 ;

Su, Shi-Jian; Cai, Chao; Kido, Junji
Chemistry of Materials, 2011 , vol. 23, # 2 p. 274 - 284